VLSI Test Principles and Architectures
Elsevier

VLSI Test Principles and Architectures

Subjects: Engineering, Electronics & communications engineering
ISBN13: 9780123705976
Published: 07 Jul 2006

Format - Hardback
By Wang,Laung-Terng

The release of this order may delay up to 4-6 weeks due to congestion at publisher’s warehouse.

Regular price A$149.33
Sale price A$149.33 Regular price A$153.95

VLSI Test Principles and Architectures

Regular price A$149.33
Sale price A$149.33 Regular price A$153.95
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