Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement
Taylor & Francis

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement - Hardback

Edition: 1st Edition
Subjects: ICT, Computer architecture & logic design
ISBN13: 9780367023430
Published: 28 Mar 2019

Format - Hardback
By Yue Ma

Usually ready in 7-10 days.

Regular price A$201.60
Sale price A$201.60 Regular price A$252.00

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement - Hardback

Regular price A$201.60
Sale price A$201.60 Regular price A$252.00
Product description

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.

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