{"product_id":"new-approaches-to-image-processing-based-failure-analysis-of-nano-scale-ulsi-devices","title":"New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices","description":"\u003cp data-mce-fragment=\"1\"\u003e\u003cspan class=\"a-text-italic\" data-mce-fragment=\"1\"\u003eNew Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices\u003c\/span\u003e\u003cspan data-mce-fragment=\"1\"\u003e introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eEngineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThis book presents novel \"smart\" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips.\u003c\/span\u003e\u003c\/p\u003e\n\u003cp data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eThe authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips.\u003c\/span\u003e\u003c\/p\u003e\n\u003cul class=\"a-unordered-list a-vertical\" data-mce-fragment=\"1\"\u003e\n\u003cli data-mce-fragment=\"1\"\u003e\u003cspan class=\"a-list-item\" data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eAcquaints users with new software-based approaches to enhance high-resolution microscope imaging of microchip structures\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003e\u003cspan class=\"a-list-item\" data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003eDemonstrates how these methods lead to productivity gains in the development of ULSI chips\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003cli data-mce-fragment=\"1\"\u003e\u003cspan class=\"a-list-item\" data-mce-fragment=\"1\"\u003e\u003cspan data-mce-fragment=\"1\"\u003ePresents several techniques for the superresolution of images, enabling engineers and scientists to improve their results in failure analysis of microelectronic chips\u003c\/span\u003e\u003c\/span\u003e\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Elsevier","offers":[{"title":"Default Title","offer_id":44124723052782,"sku":"9780323241434","price":68.06,"currency_code":"AUD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0630\/9612\/7726\/products\/9780323241434.jpg?v=1681372900","url":"https:\/\/bookland.com.au\/products\/new-approaches-to-image-processing-based-failure-analysis-of-nano-scale-ulsi-devices","provider":"Book Land AU","version":"1.0","type":"link"}