{"product_id":"measurement-and-modeling-of-silicon-heterostructure-devices-hardback","title":"Measurement and Modeling of Silicon Heterostructure Devices - Hardback","description":"\u003cp\u003eWhen you see a nicely presented set of data, the natural response is: “How did they do that; what tricks did they use; and how can I do that for myself?” Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data.\u003c\/p\u003e\u003cp\u003eDrawn from the comprehensive and well-reviewed \u003ci\u003eSilicon Heterostructure Handbook\u003c\/i\u003e, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.\u003c\/p\u003e","brand":"Taylor \u0026 Francis","offers":[{"title":"Default Title","offer_id":45575740391662,"sku":"9781420066920","price":260.8,"currency_code":"AUD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0630\/9612\/7726\/files\/9781420066920.jpg?v=1720957987","url":"https:\/\/bookland.com.au\/products\/measurement-and-modeling-of-silicon-heterostructure-devices-hardback","provider":"Book Land AU","version":"1.0","type":"link"}