{"product_id":"electron-microprobe-analysis-and-scanning-electron-microscopy-in-geology","title":"Electron Microprobe Analysis and Scanning Electron Microscopy in Geology","description":"\u003cp\u003eOriginally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.\u003c\/p\u003e","brand":"Cambridge University Press","offers":[{"title":"Default Title","offer_id":46646921789678,"sku":"9780521142304","price":71.55,"currency_code":"AUD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0630\/9612\/7726\/files\/9780521142304.jpg?v=1750162860","url":"https:\/\/bookland.com.au\/products\/electron-microprobe-analysis-and-scanning-electron-microscopy-in-geology","provider":"Book Land AU","version":"1.0","type":"link"}